Overestimating the Performance of Photon Ultraviolet Detectors
- Resource Type
- Periodical
- Authors
- Rogalski, A.
- Source
- IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(5):805-808 May, 2023
- Subject
- Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Detectors
Photodetectors
II-VI semiconductor materials
Zinc oxide
Phototransistors
Photonics
Wide band gap semiconductors
Signal fluctuation limit
BLIP limit
ultraviolet photodetectors
photogating effect
- Language
- ISSN
- 0741-3106
1558-0563
Over the past few years, the available literature shows signaled great progress in improving the performance of ultraviolet detectors, even exceeding the physical limit of detection determined by signal fluctuations. This is particularly true for Ga2O3 phototransistors and a new generation of photodetectors with active areas containing low-dimensional solids. The purpose of this letter is to show cases of overestimation of the performance of ultraviolet detectors noted by the author and to draw attention to their fundamental physical limitations which are overlooked in the characterization of detectors.