Proton, electron and heavy ion single event effects on the HAS2 CMOS Image Sensor
- Resource Type
- Conference
- Authors
- Beaumel, Matthieu; Herve, Dominique; Van Aken, Dirk; Pourrouquet, Pierre; Poizat, Marc
- Source
- 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on. :1-8 Sep, 2013
- Subject
- Components, Circuits, Devices and Systems
Photonics and Electrooptics
Protons
Radiation effects
Single event upsets
Shift registers
Arrays
CMOS Image Sensors
Radiation
- Language
The Single Event Effects sensitivity of the HAS2 CMOS Image Sensor has been characterized with protons, electrons and heavy ions. Effects in the photosensitive area and in the readout integrated circuit have been studied.