Noise Performance Improvements of 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Non-doped Pixel-FinFETs
- Resource Type
- Conference
- Source
- 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
- Subject
Components, Circuits, Devices and Systems Performance evaluation Impurities Field effect transistors Noise reduction Prototypes CMOS image sensors Very large scale integration - Language
- ISSN
- 2158-9682