Reflectometry based on two-photon absorption of a silicon avalanche photodiode
- Resource Type
- Conference
- Authors
- Tanaka, Y.; Chua, P.G.; Kurokawa, T.; Tsuda, H.; Naganuma, M.; Takeda, M.
- Source
- 2002 15th Optical Fiber Sensors Conference Technical Digest. OFS 2002(Cat. No.02EX533) Optical fiber sensors Optical Fiber Sensors Conference Technical Digest, 2002. Ofs 2002, 15th. :577-580 vol.1 2002
- Subject
- Photonics and Electrooptics
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Communication, Networking and Broadcast Technologies
Signal Processing and Analysis
Reflectometry
Absorption
Silicon
Avalanche photodiodes
Optical modulation
Photodetectors
Pulse measurements
Amplitude modulation
Optical signal processing
Photoconductivity
- Language
Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.