Near-field microwave techniques for micro- and nano-scale characterization in materials science
- Resource Type
- Conference
- Source
- 2017 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2017 International. :29-36 Oct, 2017
- Subject
Components, Circuits, Devices and Systems Engineered Materials, Dielectrics and Plasmas Photonics and Electrooptics Microwave measurement Silicon Microwave imaging Dielectric measurement Microwave circuits Transmission line measurements Near-Field Microwave Microscopy Materials Science Dielectric Materials Magnetism - Language