Single Event Latch-up and Total Ionizing Dose Characterization of a Cobham Designed Smart Power Switch Controller
- Resource Type
- Conference
- Authors
- Von Thun, Matt; Lotfi, Younes; Meade, Tim; Turnbull, Aaron
- Source
- 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020 IEEE. :1-5 Nov, 2020
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Nuclear Engineering
Photonics and Electrooptics
Testing
Springs
Switches
Logic gates
Ions
Control systems
Xenon
- Language
Single event latch-up and total ionizing dose characterization data is presented for the newly designed and fabricated Cobham radiation-hardened Smart Power Switch Controller.