SEU and SEFI Characterization of a Frontgrade QCOTS 512Gb NAND Flash Nonvolatile Memory for Space Applications
- Resource Type
- Conference
- Authors
- Nelson, Peter; Von Thun, Matt; Turnbull, Aaron; Baranski, Brian; Meade, Tim
- Source
- 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023 IEEE. :1-9 Jul, 2023
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Space vehicles
Performance evaluation
Radiation effects
Three-dimensional displays
Nonvolatile memory
Error analysis
Conferences
- Language
- ISSN
- 2154-0535
Single Event Upset (SEU) and Single Event Functional Interrupt (SEFI) radiation characterization was performed on a Frontgrade quantified-off-the-shelf (QCOTS) 512Gb 3D NAND flash memory. The device was shown to be suitable for space applications.