Mode imaging and dispersion analysis in Terahertz waveguides using Terahertz near-field microscopy
- Resource Type
- Conference
- Authors
- Mitrofanov, Oleg; Tan, Thomas; Mark, Paul R.; Bowden, Bradley; Harrington, James A.
- Source
- 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum electronics and Laser Science Conference Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on. :1-2 May, 2009
- Subject
- Components, Circuits, Devices and Systems
Photonics and Electrooptics
Optical imaging
Image analysis
Microscopy
Optical waveguides
Coatings
Hollow waveguides
Dielectrics
Probes
Propagation losses
Thickness measurement
(110.6795) Terahertz imaging
(230.7370) Waveguides
- Language
- ISSN
- 2160-9004
Mode structure, transmission loss and dispersion are characterized in low-loss (∼1dB/m) Terahertz (THz) dielectric-lined hollow metallic waveguides. THz near-field probe imaging and spectroscopy is applied for precise mode imaging and selective mode probing.