Comparison of a Power Cycling Test using Repetitive Unclamped Inductive Switching for Heat Generation with the DC Power Cycling Test
- Resource Type
- Conference
- Authors
- Abuogo, James; Schwabe, Christian; Lutz, Josef; Basler, Thomas
- Source
- 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) Power Electronics and Applications (EPE'23 ECCE Europe), 2023 25th European Conference on. :1-8 Sep, 2023
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Power, Energy and Industry Applications
Robotics and Control Systems
Transportation
Heating systems
MOSFET
Low voltage
Wires
Europe
Switches
Silicon
Power Cycling
Unclamped Inductive Switching
DC Diode-mode test
Low Voltage MOSFET
Lifetime
- Language
A power cycling test using repetitive unclamped inductive switching to generate heat is applied on low voltage silicon MOSFETs. The motivation of this approach is to introduce avalanche-generated losses, besides the conduction losses, so that the required load current can be reduced. This is important in testing low voltage MOSFETs, whereby the small on-state resistance often demands that the rated current be exceeded to achieve the desired temperature swing. The performance of this test approach is compared to that of a classical DC power cycling test in body-diode mode. The results obtained from these two tests – both lifetimes and failure modes – are found to be similar. The switching test required only 42% of the load current of the DC test. The static parameters of the devices deployed in both tests also showed similar changes.