Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array
- Resource Type
- Conference
- Authors
- Watanabe, Minoru; Kobayashi, Makoto; Isobe, Mitsutaka; Ogawa, Kunihiro; Matsuyama, Shigeo; Miwa, Misako
- Source
- 2024 IEEE International Conference on Consumer Electronics (ICCE) Consumer Electronics (ICCE), 2024 IEEE International Conference on. :1-2 Jan, 2024
- Subject
- Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
General Topics for Engineers
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Signal Processing and Analysis
Transportation
Integrated optics
Radiation effects
Neutrons
Logic gates
Adaptive optics
Task analysis
Optical arrays
- Language
- ISSN
- 2158-4001
Nuclear power plants and their decommissioning operations require radiation-hardened devices that are robust against neutron because recriticality might happen while doing decommissioning tasks. To realize devices able to withstand such environments, optically reconfigurable gate arrays have been developed. This paper presents radiation tolerance experiment results obtained for a radiation-hardened optically reconfigurable gate array using a fast-neutron beam.