Experimental studies of SAW and STW acceleration sensitivity
- Resource Type
- Conference
- Authors
- Huynh, B.; McGowan, R.; Kosinski, J.A.; Stewart, J.T.; Pierkarz, R.; Mulford, C.D.
- Source
- Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium) Frequency control Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International. :494-498 1995
- Subject
- Components, Circuits, Devices and Systems
Fields, Waves and Electromagnetics
Signal Processing and Analysis
Engineered Materials, Dielectrics and Plasmas
Surface acoustic waves
Acceleration
Oscillators
Gratings
Circuit testing
Metallization
Laboratories
Frequency
Fingers
Acoustic transducers
- Language
Comparative studies of the normal acceleration sensitivities of 360 MHz SAW and STW two-port resonators have been performed. The resonators were fabricated on the same ST-cut wafer to insure the clearest comparison. The results show that the normal acceleration sensitivities of both types of devices can easily be improved one order magnitude by selecting the appropriate aspect-ratio of the device substrate and/or mounting system. Based on these results, the normal acceleration sensitivities of the STW resonators have been further improved through modifications to the existing resonators, resulting in normal acceleration sensitivity as low as 2.93/spl times/10/sup -10//g. The measured values of the STW normal acceleration sensitivities are compared to that calculated for the case of simple supports along rectangular edges.