Dark line resonances in Cs-Ne vapor microcells for chip scale atomic clocks
- Resource Type
- Conference
- Authors
- Boudot, Rodolphe; Dziuban, Piotr; Liu, Xiaochi; Hasegawa, Madoka; Chutani, Ravinder; Galliou, Serge; Giordano, Vincent; Gorecki, Christophe
- Source
- 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum (FCS) Proceedings Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International. :1-5 May, 2011
- Subject
- Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Signal Processing and Analysis
Robotics and Control Systems
Power, Energy and Industry Applications
Resonant frequency
Frequency measurement
Microcell networks
Temperature measurement
Clocks
Laser stability
Masers
- Language
- ISSN
- 2327-1914
2327-1949
1075-6787
We report the characterization of Coherent Population Trapping (CPT) resonances in Cs vapor microcells filled with Neon (Ne) buffer gas. The impact on the atomic hyperfine resonance of some external parameters such as laser intensity and cell temperature is studied. We show the suppression of the first-order light shift by proper choice of the microwave power. The temperature dependence of the Cs ground state hyperfine resonance frequency is shown to be canceled in the 77–80°C range for various Ne buffer gas pressures. We preliminary demonstrate a 852 nm VCSEL-modulated based CPT atomic clock exhibiting a short term fractional frequency instability σ y (τ) = 1.5×10 −10 τ −1/2 until 200 s.