Radiation hardened 256K CMOS SOI SRAM
- Resource Type
- Conference
- Source
- 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on. :225-226 Nov, 2010
- Subject
Components, Circuits, Devices and Systems Engineered Materials, Dielectrics and Plasmas Computing and Processing Random access memory Radiation hardening CMOS integrated circuits Transient analysis Layout CMOS technology Silicon - Language