Total Ionizing Dose Effects in Commercial Floating-Gate-Alternative Non-Volatile Memories
- Resource Type
- Conference
- Source
- 2017 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2017 IEEE. :1-5 Jul, 2017
- Subject
Aerospace Components, Circuits, Devices and Systems Nuclear Engineering Photonics and Electrooptics Hafnium CMOS technology Indexes Total ionizing dose non-volatile memory total ionizing dose radiation effects in ICs - Language
- ISSN
- 2154-0535