Pylon: Towards an integrated customizable volume diagnosis infrastructure
- Resource Type
- Conference
- Authors
- Pan, Yan; Desineni, Rao; Sekar, Kannan; Chittora, Atul; Fernandes, Sherwin; Bawaskar, Neerja; Carulli, John
- Source
- 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-9 Nov, 2016
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Poles and towers
Databases
Engines
Automation
Foundries
Inspection
Systematics
Yield
systematics defects
scan diagnosis
volume diagnosis
yield analysis
design systematics
- Language
- ISSN
- 2378-2250
This paper describes a volume diagnosis infrastructure built on open-source software, which addresses practical challenges in a foundry environment by integrating various data sources from design, manufacturing process and test to enable rapid root-cause identification.