Analog-to-Digital Converter Dynamic Testing by Linearized Four-Parameter Sine-Fit Algorithm
- Resource Type
- Conference
- Authors
- Belega, Daniel; Petri, Dario
- Source
- 2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI) Research and Technology for Society and Industry (RTSI), 2021 IEEE 6th International Forum on. :502-506 Sep, 2021
- Subject
- Aerospace
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Industries
Closed-form solutions
Heuristic algorithms
Computer simulation
IEEE Standards
Analog-digital conversion
Standards
analog-to-digital converter testing
error analysis
parameter estimation
sine-fit algorithm
statistical analysis
- Language
- ISSN
- 2687-6817
In this paper a linearized version of the four-parameter sine-fit algorithm suggested in the IEEE Standard 1241 for the dynamic testing of analog-to-digital converters is proposed. Algorithm linearization is performed through the Gauss-Newton method and the related closed form expressions are provided. The accuracies of the proposed and the classical versions of the four-parameter sine-fit algorithm are compared each other by means of both computer simulations and experimental results.