Instantaneous S parameters measurements of MESFETs under burst bias conditions
- Resource Type
- Conference
- Source
- Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE. :858-861 vol.2 1994
- Subject
Components, Circuits, Devices and Systems Signal Processing and Analysis General Topics for Engineers Robotics and Control Systems Power, Energy and Industry Applications Scattering parameters MESFETs Voltage Electromagnetic heating Gallium arsenide Microwave devices Envelope detectors Radio frequency Integrated circuit technology Conducting materials - Language