Optical constant and thickness determination using THz time-domain reflection-only signals
- Resource Type
- Conference
- Authors
- Haffar, Salah; Hasar, Ugur Cem; Barroso, Joaquim Jose
- Source
- 2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC) Microwave and Optoelectronics Conference (IMOC), 2017 SBMO/IEEE MTT-S International. :1-5 Aug, 2017
- Subject
- Aerospace
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Signal Processing and Analysis
Silicon
Gallium arsenide
Biomedical optical imaging
Optical sensors
Time-domain analysis
Optical variables measurement
Ultrafast optics
Terahertz
optical constants
calibration-free
reflection-only
time-domain
- Language
A self-calibration noniterative technique for determination of the optical constants and thickness of lossless materials using only three reflection measurements is proposed. A generalized model is derived based on the reflection measurements. For validation, two different samples (Si and GaAs samples) are considered for extraction of their optical parameters and thicknesses by using a numerical full wave electromagnetic simulator. It is demonstrated that the proposed method can retrieve highly accurate results provided that reflected signal components are accurately separated.