Initial In-Flight Error Rates for 16-MB SRAM as Flying on the Double Asteroid Redirection Test (DART) Mission
- Resource Type
- Periodical
- Authors
- Likar, J.J.; Pham, C.H.; Wilson, D.; Coburger, A.; Atchison, J.; Porter, J.
- Source
- IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(4):426-433 Apr, 2023
- Subject
- Nuclear Engineering
Bioengineering
Space vehicles
Random access memory
Error analysis
Solar system
Uncertainty
Earth
Planetary orbits
Radiation hardening (electronics)
radiation monitoring
single event latchup
space radiation
- Language
- ISSN
- 0018-9499
1558-1578
In-flight static random access memory (SRAM) single bit error (SBE) rates are compared to a series of rate prediction methods in an effort to demonstrate methods for uncertainty propagation and reduction. Supplier ground test data are statistically processed via Monte Carlo methods and considering detailed 3-D spacecraft-level geometries. In-flight rates are considered for the UT8R4M39 SRAM flying in NASA’s Double Asteroid Redirection Test (DART) spacecraft avionics single board computer (SBC) prior to impacting the asteroid Dimorphos.