CMOS differential and absolute thermal sensors
- Resource Type
- Conference
- Authors
- Syal, A.; Lee, V.; Andre, I.; Altet, J.
- Source
- Proceedings Seventh International On-Line Testing Workshop On-line testing workshop On-Line Testing Workshop, 2001. Proceedings. Seventh International. :127-132 2001
- Subject
- Communication, Networking and Broadcast Technologies
Computing and Processing
Signal Processing and Analysis
Thermal sensors
Circuit testing
Temperature sensors
Circuit faults
CMOS technology
Sensor phenomena and characterization
Temperature measurement
CMOS digital integrated circuits
Semiconductor device measurement
Integrated circuit testing
- Language
This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 /spl mu/m CMOS technology.