Compact model for parametric instability under arbitrary stress waveform
- Resource Type
- Conference
- Authors
- Alagi, Filippo; Rossetti, Mattia; Stella, Roberto; Vigano, Emanuele; Raynaud, Philippe
- Source
- 2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :270-273 Sep, 2014
- Subject
- Bioengineering
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Power, Energy and Industry Applications
Stress
Integrated circuit modeling
Temperature measurement
Logic gates
Threshold voltage
Voltage measurement
Stress measurement
Compact model
instability
NBTI
recovery
- Language
- ISSN
- 1930-8876
2378-6558
A deterministic compact model of instability is presented, capable of simulating reversible parametric drift under any periodic stress waveform and suitable for the implementation in a commercial simulator (Eldo UDRM). The methodology has been applied to NBTI-induced threshold voltage drift; an example is shown, in which recovery simulation is crucial for circuit design.