双联碳膜解决纳米晶体在TEM中碳污染的研究 / Study on duplex carbon film to solve carbon pollution of nanocrystals in TEM
- Resource Type
- Academic Journal
- Source
- 电子显微学报 / Journal of Chinese Electron Microscopy Society. 42(2):223-229
- Subject
碳污染 透射电子显微镜 超薄双联碳膜 - Language
- Chinese
- ISSN
- 1000-6281