Development of a New Methodology to Model the Synergistic Effects Between TID and ASETs
- Resource Type
- Authors
- Jerome Boch; Francoise Bezerra; S. P. Buchner; L. Dusseau; B. Azais; Y G Velo; N. J-H Roche; P. Calvel; R. Marec; J.-R. Vaille; Frédéric Saigné; G. Auriel
- Source
- IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2010, 57 (4), pp.1861-1868. ⟨10.1109/TNS.2010.2042616⟩
- Subject
- Nuclear and High Energy Physics
Engineering
Materials science
01 natural sciences
Bipolar circuits
law.invention
law
Control theory
High-level synthesis
0103 physical sciences
Electronic engineering
Transient response
Electrical and Electronic Engineering
010306 general physics
ComputingMilieux_MISCELLANEOUS
010308 nuclear & particles physics
business.industry
Transistor
Supply current
[SPI.TRON]Engineering Sciences [physics]/Electronics
Nuclear Energy and Engineering
Absorbed dose
Operational amplifier
business
Network analysis
Degradation (telecommunications)
- Language
- ISSN
- 1558-1578
0018-9499
A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the analog single event transients propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier.