Spectroscopic Ellipsometry Characterization of Optical Properties for Ti-Doped SiO2 Mesoporous Films
- Resource Type
- Authors
- Zuyao Sun; Lanfang Yao; Chun-Xiao Yue; Kaiming Jiang
- Source
- Integrated Ferroelectrics. 127:15-20
- Subject
- Ammonium bromide
Materials science
Doping
Analytical chemistry
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
Characterization (materials science)
chemistry.chemical_compound
chemistry
Control and Systems Engineering
Ellipsometry
Dispersion relation
Materials Chemistry
Ceramics and Composites
Electrical and Electronic Engineering
Porosity
Mesoporous material
Refractive index
- Language
- ISSN
- 1607-8489
1058-4587
Ti-doped SiO2 Mesoporous films were synthesized by sol-gel process using surfactant cetyltrimethyl ammonium bromide as the template. Spectroscopic ellipsometer and UV-VIS spectrophotometer were used to characterize the optical properties. The Cauchy model is presented well in fitting spectroscopic ellipsometric data for the optical constants. The relation between miscrostructure, optical constants and optical character are discussed. The results show that Ti+4 cations have no effect on the dispersion relation of the films while they have obvious effect on the value of the optical constants. The refractive index is inversely proportional to the porosity of the films.