A high fault coverage march test for 1T1R memristor array
- Resource Type
- Source
- 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC).
- Subject
Very-large-scale integration Computer science 020208 electrical & electronic engineering Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology Memristor Fault (power engineering) Electronic mail 020202 computer hardware & architecture law.invention Set (abstract data type) Computer engineering law Fault coverage 0202 electrical engineering, electronic engineering, information engineering Algorithm design Time complexity - Language