Effects of Positive and Negative Stresses on III-V MOSFETs With Al2O3 Gate Dielectric
- Resource Type
- Source
- Birck and NCN Publications
- Subject
stress reliability gate dielectrics mental disorders III–V MOSFET III-V MOSFET SOFT BREAKDOWN MOBILITY OXIDE ENHANCEMENT CHANNEL CHARGE LAYERS NOISE Nanoscience and Nanotechnology - Language