MOCVD Epitaxy and Characterization of III-As and III-P Thin Layers on 300mm Silicon Substrate
- Resource Type
- Authors
- Martin, Mickael; Cipro, Romain; Billaud, M.; Moeyaert, Jérémy; Bassani, Franck; Arnaud, S.; David, Sylvain; Gorbenko, Viktoriia; Barnes, Jean-Paul; Boutry, Hervé; Duvernay, Julien; Casse, M.; Bogumilowicz, Yann; Rochas, N.; Chauvin, Nicolas; Bao, X.; Ye, Zhiyuan; Pin, J.; Sanchez, E.; Baron., T.
- Source
- MRS Spring Meeting
MRS Spring Meeting, 2015, San Francisco, California, United States. 2015
MRS Spring Meeting, Apr 2015, San Francisco, California, United States. 2015
- Subject
- [SPI]Engineering Sciences [physics]
[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
ComputingMilieux_MISCELLANEOUS
[SPI.MAT]Engineering Sciences [physics]/Materials
- Language
- English
International audience; no abstract