Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques
Resource Type
Authors
Bojar, Aleksandra ; Marchat, Clément ; Alvarez, J ; Schulz, Philip ; Kleider, Jean-Paul
Source
JNPV 2019 JNPV 2019, Dec 2019, Dourdan, France 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28) 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France
Subject
[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics [SPI.NRJ]Engineering Sciences [physics]/Electric power [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics [SPI.MAT] Engineering Sciences [physics]/Materials ComputingMilieux_MISCELLANEOUS [PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] [SPI.MAT]Engineering Sciences [physics]/Materials [SPI.NRJ] Engineering Sciences [physics]/Electric power
Language
English