Case study of DPI robustness of a MOS-SCR structure for automotive applications
- Resource Type
- Authors
- Akram A. Salman; Farzan Farbiz; Yue Zu; Gianluca Boselli; Yang Xiu; Elyse Rosenbaum; Mariano Dissegna
- Source
- 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
- Subject
- 010302 applied physics
Engineering
Electrostatic discharge
business.industry
Automotive industry
020206 networking & telecommunications
Hardware_PERFORMANCEANDRELIABILITY
02 engineering and technology
01 natural sciences
Robustness (computer science)
0103 physical sciences
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
business
Hardware_LOGICDESIGN
Electronic circuit
- Language
This paper presents a case study to demonstrate that transient-triggered ESD protection circuits may fail the DPI automotive requirement. A novel scheme is devised to improve the DPI performance of a MOSSCR protection device while maintaining the system-level ESD performance.