Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X‑ray Scattering.
- Resource Type
- Article
- Authors
- Mrkyvkova, Nada; Nadazdy, Peter; Hodas, Martin; Jianwei Chai; Shijie Wang; Dongzhi Chi; Sojkova, Michaela; Hulman, Martin; Chumakov, Andrei; Konovalov, Oleg V.; Hinderhofer, Alexander; Jergel, Matej; Majkova, Eva; Siffalovic, Peter; Schreiber, Frank
- Source
- Crystal Growth & Design; 8/5/2020, Vol. 20 Issue 8, p5269-5276, 8p
- Subject
- Language
- ISSN
- 15287483