Thickness-Dependent Domain Relaxation Dynamics Study in Epitaxial K0.5 Na0.5 NbO3 Ferroelectric Thin Films.
- Resource Type
- Article
- Source
- ACS Applied Materials & Interfaces; 8/4/2021, Vol. 13 Issue 30, p36407-36415, 9p
- Subject
- Language
- ISSN
- 19448244