Characterisation of Epitaxial Lateral Overgrown GaN by Electron Backscatter Diffraction Correlated with Cross-Sectional Cathodoluminescence Spectroscopy.
- Resource Type
- Article
- Source
- Microscopy & Microanalysis; Aug2006 Supplement, Vol. 12 Issue S02, p1516-1517, 2p
- Subject
- Language
- ISSN
- 14319276