Analysis and Simulation of Interface Quality and Defect Induced Variability in MgO Spin-Transfer Torque Magnetic RAMs.
- Resource Type
- Article
- Source
- IEEE Electron Device Letters; Jan2021, Vol. 42 Issue 1, p34-37, 4p
- Subject
MAGNETIC torque ACTIVATION energy TUNNEL magnetoresistance CHARGE exchange TORQUE - Language
- ISSN
- 07413106