Probing Long-Range Coulomb Interactions in Nanoscale MOSFETs.
- Resource Type
- Article
- Source
- IEEE Electron Device Letters; Dec2013, Vol. 34 Issue 12, p1563-1565, 3p
- Subject
PLASMONS (Physics) LOGIC circuits NANOELECTROMECHANICAL systems ELECTRONICS FIELD-effect transistors SCATTERING (Physics) - Language
- ISSN
- 07413106