A New Variable-Censoring Control Chart Using Lifetime Performance Index under Exponential and Weibull Distributions.
- Resource Type
- Academic Journal
- Authors
- Aslam M; Department of Statistics, Faculty of Science, King Abdulaziz University, Jeddah, Saudi Arabia.; Jeyadurga P; Department of Mathematics, Kalasalingam University, Krishnankoil 626126, Tamilnadu, India.; Balamurali S; Department of Mathematics, Kalasalingam University, Krishnankoil 626126, Tamilnadu, India.; Khan Sherwani RA; College of Statistical and Actuarial Sciences, University of the Punjab, Lahore, Pakistan.; Albassam M; Department of Statistics, Faculty of Science, King Abdulaziz University, Jeddah, Saudi Arabia.; Jun CH; Department of Industrial and Management Engineering, POSTECH, Pohang 37673, Republic of Korea.
- Source
- Publisher: Hindawi Pub. Corp Country of Publication: United States NLM ID: 101279357 Publication Model: eCollection Cited Medium: Internet ISSN: 1687-5273 (Electronic) NLM ISO Abbreviation: Comput Intell Neurosci Subsets: MEDLINE
- Subject
- Language
- English
In reliability theory or life testing, exponential distribution and Weibull distribution are frequently considered to model the lifetime of the components or systems. In this paper, we design a control chart based on the lifetime performance index using Type II censoring for exponential and Weibull distributions. Average run length helps to measure the performance of the proposed control chart. The optimal values of the number of failure items and decision criteria used to decide whether the process is in-control or out-of-control based on the sample results are determined such that the in-control average run length is as close as to the specified average run length values. We simulate the data to illustrate the performance of the proposed control chart.
Competing Interests: The authors declare that they have no conflicts of interest.
(Copyright © 2021 Muhammad Aslam et al.)