Development and Characterization of Titanium Dioxide Ceramic Substrates with High Dielectric Permittivities.
- Resource Type
- Academic Journal
- Authors
- Freitas AE; REDEMAT-Laboratório de Engenharia de Superfícies e Técnicas Afins-LESTA, Centro Histórico, Universidade Federal de Ouro Preto, 35400-000 Ouro Preto, Brazil.; Departamento de Tecnologia em Engenharia Civil, Computação e Humanidades-DTECH, Campus Alto Paraopeba, Universidade Federal de São João del Rei, 36301-158 Ouro Branco, Brazil.; Manhabosco TM; Departamento de Física-DEFIS/REDEMAT, Campus Universitário Morro do Cruzeiro, Universidade Federal de Ouro Preto, 35400-000 Ouro Preto, Brazil.; Batista RJC; Departamento de Física-DEFIS/REDEMAT, Campus Universitário Morro do Cruzeiro, Universidade Federal de Ouro Preto, 35400-000 Ouro Preto, Brazil.; Segundo AKR; Departamento de Engenharia de Controle e Automação-DECAT, Campus Universitário Morro do Cruzeiro, Universidade Federal de Ouro Preto, 35400-000 Ouro Preto, Brazil.; Araújo HX; Colegiado de Engenharia Elétrica, Universidade Federal do Tocantins, 77600-000 Palmas, Brazil.; Araújo FGS; Departamento de Física-DEFIS/REDEMAT, Campus Universitário Morro do Cruzeiro, Universidade Federal de Ouro Preto, 35400-000 Ouro Preto, Brazil.; Costa AR; REDEMAT-Laboratório de Engenharia de Superfícies e Técnicas Afins-LESTA, Centro Histórico, Universidade Federal de Ouro Preto, 35400-000 Ouro Preto, Brazil.
- Source
- Publisher: MDPI Country of Publication: Switzerland NLM ID: 101555929 Publication Model: Electronic Cited Medium: Print ISSN: 1996-1944 (Print) Linking ISSN: 19961944 NLM ISO Abbreviation: Materials (Basel) Subsets: PubMed not MEDLINE
- Subject
- Language
- English
- ISSN
- 1996-1944
Titanium dioxide substrates have been synthesized by means of solid-state reactions with sintering temperatures varying from 1150 °C up to 1350 °C. X-ray diffraction and scanning electron microscopy (SEM) where employed to investigate the crystal structure, grain size and porosity of the resulting samples. The obtained ceramics are tetragonal (rutile phase) with average grain sizes varying from 2.94 µm up to 5.81 µm. The average grain size of samples increases with increasing temperature, while the porosity decreases. The effect of microstructure on the dielectric properties has been also studied. The reduction of porosity of samples significantly improves the dielectric parameters (relative dielectric permittivity and loss tangent) in comparison to those of commercial substrates, indicating that the obtained ceramic substrates could be useful in the miniaturization of telecommunication devices.