Corrigendum to "Atomistic insights into bias-induced oxidation on passivated silicon surface through ReaxFF MD simulation" [Appl. Surf. Sci. 626 (2023) 157253].
- Resource Type
- Article
- Source
Applied Surface Science . Sep2023, Vol. 632, pN.PAG-N.PAG. 1p.- Subject
- *
SILICON surfaces
*OXIDATION - Language
- ISSN
- 0169-4332