Film Capacitor Degradation under Electrical and Thermal Stresses Based on Capacitance Loss
- Resource Type
- Conference
- Authors
- Li, Zheng; Li, Hua; Qiu, Tian; Lin, Fuchang; Zhang, Guohao; Zhang, Qin
- Source
- 2023 IEEE Electrical Insulation Conference (EIC) Electrical Insulation Conference (EIC), 2023 IEEE. :1-4 Jun, 2023
- Subject
- Engineered Materials, Dielectrics and Plasmas
Power, Energy and Industry Applications
Degradation
Electrodes
Capacitors
Moisture
Voltage
Capacitance
Oxidation
film capacitor
degradation
voltage
thermal stress
- Language
- ISSN
- 2576-6791
With the rise of temperature and voltage, the electrode oxidation of film capacitors under AC voltage becomes more significant. This paper focuses on the effects of AC voltage amplitude and temperature on capacitor degradation. An electrothermal aging model is first proposed based on oxidation kinetics. A temperature-humidity-bias (THB) accelerated aging test is carried out for two types of film capacitors from different manufacturers under a variety of electrical and thermal stresses. The results indicate that the effect of voltage is more significant than that of temperature. The capacitance loss of encapsulated film capacitors could be divided into the linear stage and acceleration stage. The duration of the former one is determined by the moisture ingress process in the encapsulation and decreases with the increasing temperature, while it changes little with voltage. This work would enable a better understanding of the effect mechanism of AC voltage and temperature on the film capacitor degradation caused by electrode oxidation, and can be used for lifetime estimation to enhance the reliability of the system.