| 000 | cam | |
| 001 | 2210080474787 | |
| 005 | 20010215094350.0 | |
| 008 | 850529s1985 wb a b 00110 eng | |
| 020 | ▼a3540135308 | |
| 020 | ▼a0387135308 (U.S.) | |
| 040 | ▼aDLC▼cDLC▼dDLC▼d221008 | |
| 050 | ▼aQH212.S3▼bR452 1985 | |
| 082 | ▼a535/.3325▼219 | |
| 100 | ▼aReimer, Ludwig,▼d1928- | |
| 245 | 00 | ▼aScanning electron microscopy :▼bphysics of image formation and microanalysis /▼cLudwig Reimer. |
| 260 | ▼aBerlin ;▼aNew York :▼bSpringer-Verlag,▼cc1985. | |
| 300 | ▼axviii, 457 p. :▼bill. ;▼c24 cm. | |
| 440 | ▼aSpringer series in optical sciences ;▼vv. 45 | |
| 500 | 00 | ▼aIncludes index. |
| 504 | ▼aBibliography: p. [405]-446. | |
| 541 | ▼cGift;▼a홍진태 자연과학대학 자연과학부 교수;▼d2001.08.14▼e(W0141143) | |
| 650 | ▼aScanning electron microscopy. | |
| 950 | ▼aFB | |
| 950 | ▼b￦0 |
Scanning electron microscopy :physics of image formation and microanalysis
종류
단행본 서양서
서명
Scanning electron microscopy :physics of image formation and microanalysis
저자명
총서명
Springer series in optical sciences ; vv. 45
발행사항
New York : Springer-Verlag c1985.
형태사항
xviii, 457 p : ill. ; 24 cm.
주기사항
Includes index. / Bibliography: p. [405]-446.