Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :211-215 2004
2006 International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 2006 International Symposium on. :1-2 Apr, 2006