학술논문

1 . Academic Journal
Time-multiplexed vector light field display with intertwined views via metagrating matrix

저자

by Hua, Jianyu ; Li, Yang ; Ge, Peiran ; Yi, Donghui ; Chen, Linsen ; Qiao, Wen

소스

In Optics and Lasers in Engineering May 2023 164
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2 . Conference
Robot-Assisted Trajectory Planning Method for NDT

저자

by Wang, Pengfei; Dong, Xiang; Yang, Yang; Cheng, Yong

소스

2023 IEEE 6th International Conference on Industrial Cyber-Physical Systems (ICPS) Industrial Cyber-Physical Systems (ICPS), 2023 IEEE 6th International Conference on. :1-6 May, 2023
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3 . Conference
An improved 3D reconstruction method for weak texture objects combined with calibration and ICP registration

저자

by Qin, Lang; Chen, Xin; Gong, Xuan

소스

2023 IEEE 6th International Conference on Industrial Cyber-Physical Systems (ICPS) Industrial Cyber-Physical Systems (ICPS), 2023 IEEE 6th International Conference on. :1-5 May, 2023
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4 . Conference
Is Education Ready To Embrace Metaverse?

저자

by Ktoridou, Despo; Epaminonda, Epaminondas; Efthymiou, Leonidas

소스

2023 IEEE Global Engineering Education Conference (EDUCON) Engineering Education Conference (EDUCON), 2023 IEEE Global. :1-5 May, 2023
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5 . Conference
Changes in High-School Student Attitude and Perception Towards Cybersecurity Through the Use of an Interactive Animated Visualization Framework

저자

by Sudha, Sai Suma; Aguayo, Gabriel Castro; Angulo, Abel R; Kothakapu, Jyothirmai; Niyaz, Quamar; Yang, Xiaoli; Javaid, Ahmad Y

소스

2023 IEEE Global Engineering Education Conference (EDUCON) Engineering Education Conference (EDUCON), 2023 IEEE Global. :1-10 May, 2023
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6 . Conference
A Gamified Approach to Concrete Structure's Interpretation using Virtual Reality: A Study of Performance and Simulation Sickness

저자

by Al-Khiami, Mohamad Iyad; Jaeger, Martin; Soleimani, Sayed Mohamad

소스

2023 IEEE Global Engineering Education Conference (EDUCON) Engineering Education Conference (EDUCON), 2023 IEEE Global. :1-6 May, 2023
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7 . Conference
Machine Learning for Deep Trench Bottom Width Measurements using Scatterometry : AM: Advanced Metrology

저자

by Srichandan, Sasmita; Heider, Franz; Polak, Yulia; Ehrentraut, Georg; Juhasz, Laszlo; Haberjahn, Martin; Sakalauskas, Egidijus; Haupt, Ronny

소스

2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-6 May, 2023
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8 . Conference
Innovative Approaches for RG 3D NAND CMP Buff Steps Elimination with Fab Cost and Carbon Footprint Reduction : GF: Green Factory

저자

by Dong, Xinqiao; Yong, Yaolun; Wong, Hsuehchuang; McCabe, Russell; Mukherjee, Subhadeep; Yang, Yi

소스

2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-5 May, 2023
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9 . Conference
Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio Etching Process

저자

by Chang, Chih-Chin; Hsiao, Ching-Hung; Chen, Yi-Che; Wang, Ching-Hung; Chung, Yao-An; Wang, Li-Wei; Lee, Hong-Ji; Lian, Nan-Tzu; Lee, Shih-Chin; Han, Tzung-Ting; Yang, Tahone; Chen, Kuang-Chao; Lu, Chih-Yuan

소스

2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-4 May, 2023
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10 . Conference
Common Source Line-to-Word Line Short Improvement by Eliminating SLT Sidewall Notch in 3D NAND Deep Trench Patterning

저자

by Chung, Yao-An; Chu, Yuan-Chieh; Chang, Chih-Chin; Lee, Hong-Ji; Lian, Nan-Tzu; Yang, Tahone; Chen, Kuang-Chao; Lu, Chih-Yuan

소스

2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-4 May, 2023
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