2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). VLSI design, automation & test VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on. :20-23 2005
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Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) Current and defect based testing Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on. :99-104 2004
Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. Memory technology, design and testing Memory Technology, Design and Testing, 2004. Records of the 2004 International Workshop on. :65-69 2004
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