microelectronics reliability (6)
materials science forum (5)
2005 electrical overstress/electrostatic discharge symposium, electrical overstress/electrostatic discharge symposium, 2005. eos/esd '05. (3)
2007 29th electrical overstress/electrostatic discharge symposium (eos/esd), 29th electrical overstress/electrostatic discharge symposium, 2007. eos/esd (3)
2009 31st eos/esd symposium, eos/esd symposium, 2009 31st (3)
electrical overstress/electrostatic discharge symposium proceedings 2010, electrical overstress/ electrostatic discharge symposium (eos/esd), 2010 32nd (2)
2006 electrical overstress/electrostatic discharge symposium (1)
2006 electrical overstress/electrostatic discharge symposium, electrical overstress/electrostatic discharge symposium, 2006. eos/esd '06. (1)
2007 14th international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits, 2007. ipfa 2007. 14th international symposium on the (1)
2007 ieee international reliability physics symposium proceedings. 45th annual, reliability physics symposium, 2007. proceedings. 45th annual. ieee international (1)
2010 ieee international reliability physics symposium, reliability physics symposium (irps), 2010 ieee international (1)
2012 24th international symposium on power semiconductor devices & ics (1)
2012 24th international symposium on power semiconductor devices and ics, power semiconductor devices and ics (ispsd), 2012 24th international symposium on (1)
2016 ieee 4th workshop on wide bandgap power devices & applications (wipda) (1)
2016 ieee 4th workshop on wide bandgap power devices and applications (wipda), wide bandgap power devices and applications (wipda), 2016 ieee 4th workshop on (1)
2017 ieee applied power electronics conference and exposition (apec), applied power electronics conference and exposition (apec), 2017 ieee (1)
ecs transactions (1)
eos/esd 2008 - 2008 30th electrical overstress/electrostatic discharge symposium, electrical overstress/electrostatic discharge symposium, 2008. eos/esd 2008. 30th (1)
ieee transactions on device & materials reliability (1)
ieee transactions on device and materials reliability (1)
key engineering materials (1)