The traditional method of sneak circuits analysis is based on the premise that component performance degradation is not considered, so that the results of analysis is idealized. This paper presents a method of sneak circuits analysis considering component performance degradation under the digital twin model. Firstly, a five-dimensional digital twin model of circuit is established, and the effect of component performance degradation on digital twin model of circuit is analyzed. According to the component performance degradation process obeys the Wiener process, the component performance degradation model is established and the probability density function and probability distribution of component life are derived. On this basis, the probability of sneak circuits caused by component performance degradation is obtained. Finally, the effectiveness of the proposed method is verified by analyzing the sneak circuits caused by component performance degradation in the ignition shutdown circuit of the Red stone rocket.