The atomic layer deposition of cobalt using Co(DAD) 2 and tertiary-butyl amine (TBA) has nearly infinite selectivity (>1000 cycles) on metal vs. insulator (SiO 2 or low-k SiCOH) planar samples. However, on patterned samples, selectivity under identical ALD conditions is limited, due to the diffusion of molecularly-adsorbed metal precursor from reactive to non-reactive surfaces. Four strategies have been found to improve Co ALD selectivity: adding a passivant to remove insulator defect sites, increasing the purge time, decreasing the precursor dose, and periodic annealing. The periodic annealing technique allows reabsorption of the Co nuclei from the insulator surface to the growth surface and is consistent with a low temperature reflow process.