SEE Characteristics of COTS Devices by 1064nm Pulsed Laser Backside Testing
- Resource Type
- Conference
- Authors
- Yingqi, Ma; Jianwei, Han; ShiPeng, Shangguan; Rui, Chen; Xiang, Zhu; Yue, Li; Yueying, Zhan
- Source
- 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018 IEEE. :1-4 Jul, 2018
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Nuclear Engineering
Photonics and Electrooptics
Testing
Laser theory
Semiconductor lasers
Measurement by laser beam
Single event upsets
Single event effects
COTS devices
pulsed laser
equivalent LET
- Language
- ISSN
- 2154-0535
Commercial-off-the-shelf (COTS) devices are selected to use in the satellite instruments for the convenience with high performance and low cost. This work presents the results and analysis investigating on Single Event Upset (SEU) and Single Event Latch-up (SEL) characteristics of the COTS devices by backside laser testing. The modified equivalent LET (ELET) and its uncertainty are verified by the laser and heavy ion testing of several CMOS devices.