Integrated near field scaning system for high frequency deivces
- Resource Type
- Conference
- Authors
- Li, Hengxu; Zhu, Boyuan; Varnoosfadeani, M. Vatankhah; Lu, Junwei
- Source
- Proceedings of 2014 3rd Asia-Pacific Conference on Antennas and Propagation Antennas and Propagation (APCAP), 2014 3rd Asia-Pacific Conference on. :1447-1450 Jul, 2014
- Subject
- Communication, Networking and Broadcast Technologies
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Solid modeling
Three-dimensional displays
Antenna measurements
Finite element analysis
Numerical models
Switches
Antennas
near-field
3D scanning
integrated system
FEM simulation
- Language
In electromagnetic interference (EMI) investigation, localization of real EMI sources in the near-field region is always in concern. This paper introduces an integrated near-field scanning system (INFSS) that handles electromagnetic near-field measurement of arbitrary three-dimension (3D) shape of high frequency devices in conjunction with numerical modelling and simulation results. It performs both finite element method (FEM) based numerical simulation and 3D near-field scanning function that help engineer to increase the project development efficiency and reduce the development time cost. A case study of a dual mode switch parasitic antenna is presented from design to measurement using INFSS.