Influence of CPW Dimension on Quality Factor in Microwave Measurement
- Resource Type
- Conference
- Authors
- Cao, Xin; Wu, Yunqiu; Tang, Zongxi; Zhang, Biao
- Source
- 2012 IEEE 12th International Conference on Computer and Information Technology Computer and Information Technology (CIT), 2012 IEEE 12th International Conference on. :990-993 Oct, 2012
- Subject
- Computing and Processing
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Coplanar waveguides
Q factor
Metals
Permittivity measurement
Conductors
Microwave measurements
Materials
- Language
In this paper, open CPW (coplanar wave guide) resonator structure is utilized to measure the complex permittivity of thin film materials. The optimal width of CPW resonator and the metal plane thickness are determined. Quasi-TEM analysis and electromagnetic simulation are adopted. The results show that, high quality factor has been achieved and measurement error has been remarkably reduced and the measurement procedure has been greatly simplified.