ADDLL/VDD-biasing co-design for process characterization, performance calibration, and clock synchronization in variation-tolerant designs
- Resource Type
- Conference
- Authors
- Wang, Jinn-Shyan; Yung-Chen Chien; Jia-Hong Lin; Cheng, Chun-Yuan; Ying-Ting Ma; Chung-Hsun Huang
- Source
- 2011 9th IEEE International Conference on ASIC ASIC (ASICON), 2011 IEEE 9th International Conference on. :47-50 Oct, 2011
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Communication, Networking and Broadcast Technologies
Signal Processing and Analysis
CMOS technology
Calibration
Clocks
CMOS integrated circuits
- Language
- ISSN
- 2162-7541
2162-755X
This work proposes an ADDLL/VDD-biasing co-design methodology for variation-tolerant designs. A modified ADDLL behaves as a variability sensor in the beginning of operation, and the sensing result is used by a VDD-biasing circuit to adjust the VDD of a loaded design for performance calibration. During normal operation, the ADDLL is reused as a de-skewing element for the calibrated design. With this methodology, not only the performance of the loaded design but also that of the ADDLL can be effectively adjusted toward their design specifications even under serious process variations.