ESD system level characterization and modeling methods applied to a LIN transceiver
- Resource Type
- Conference
- Source
- EOS/ESD Symposium Proceedings Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd. :1-9 Sep, 2011
- Subject
Fields, Waves and Electromagnetics Engineered Materials, Dielectrics and Plasmas Power, Energy and Industry Applications Signal Processing and Analysis Photonics and Electrooptics Integrated circuit modeling Electrostatic discharge Hidden Markov models Capacitors Stress Current measurement - Language